Semiconductor band structure as determined from angle resolved photoelectron spectroscopy

Abstract The methodology in common use for the determination of the band structure of semiconductors from angle resolved ultraviolet photoelectron spectroscopic data is examined critically. The importance of an accurate determination of the binding energy of the valence band maximum and of the use of reliable approximations to the final state bands is highlighted. A critical review of published determinations of the band structure of a number of important tetrahedrally bound semiconductors is presented.