Aluminum‐Based Chalcopyrite Thin Films and Solar Cells
Source abstract
Abstract
Abstract Aluminum‐based chalcopyrite materials have attracted attention because of the wide controllability range of their material properties and potential for use in energy‐conversion devices. Herein, CuAlSe2‐based thin‐film growth and solar cell device properties are discussed. Ternary CuAlSe2 thin films are relatively unstable and decompose weeks after film growth, even when preserved in a dry box. However, alloying with elemental In led to significant improvements in stability. Cu(In,Al)Se2 (CIAS) solar cells yield better photovoltaic performance than CuInSe2 cells, although the effective range of Al concentration that can improve device performance is narrower than that of elemental Ga in Cu(In,Ga)Se2 (CIGS). A decrease in the alkali metal concentration in CIAS films with increasing Al concentration is observed, indicating that the formation energy of alkali‐metal substitutional defects on the Cu site is high, and/or Al‐related complex defects formed are kinetically stable and difficult to replace with alkali metals once they form. Although the direct observation of alkali metals in the bulk (grain interior) of chalcopyrite CuInSe2 and CIGS films has been difficult to date, this result can serve as indirect evidence of the presence of alkali metals in the bulk of CuInSe2 films.
Source: crossref · Quality: baseline
Research context
OpenAlex topics: Chalcogenide Semiconductor Thin Films · Semiconductor materials and interfaces · Quantum Dots Synthesis And Properties
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
Global Zero Emission Research Center National Institute of Advanced Industrial Science and Technology 1‐1‐1 Umezono Tsukuba Ibaraki 305‐8568 Japan
Research Institute of Electrochemical Energy National Institute of Advanced Industrial Science and Technology 1‐8‐31 Midorigaoka Ikeda Osaka 563‐8577 Japan
Funding
New Energy and Industrial Technology Development Organization
References (76)
Show source-provided references
1. 10.1016/0038-1101(63)90078-910.1016/0038-1101(63)90078-9 ↗
2. 10.1143/JJAP.16.120310.1143/JJAP.16.1203 ↗
3. 10.1063/1.10962910.1063/1.109629 ↗
4. 10.1002/pip.52510.1002/pip.525 ↗
5. 10.1038/ncomms330610.1038/ncomms3306 ↗
6. 10.1038/nenergy.2016.1510.1038/nenergy.2016.15 ↗
7. 10.1063/1.11267010.1063/1.112670 ↗
8. 10.1002/pip.107810.1002/pip.1078 ↗
9. 10.1002/aenm.20190040810.1002/aenm.201900408 ↗
10. 10.1109/JPHOTOV.2019.293721810.1109/JPHOTOV.2019.2937218 ↗
11. 10.1038/s41560-022-01157-910.1038/s41560-022-01157-9 ↗
12. 10.1063/1.10547210.1063/1.105472 ↗
13. 10.1143/JJAP.30.L162010.1143/JJAP.30.L1620 ↗
14. 10.1049/el:1993099410.1049/el:19930994 ↗
15. 10.1103/PhysRevB.47.1272710.1103/PhysRevB.47.12727 ↗
16. 10.1038/3509801210.1038/35098012 ↗
17. 10.1002/pip.375010.1002/pip.3750 ↗
18. 10.7567/JJAP.56.04CA0210.7567/JJAP.56.04CA02 ↗
19. 10.1016/0038-1098(86)90709-X10.1016/0038-1098(86)90709-X ↗
20. 10.1143/JJAP.32.L104910.1143/JJAP.32.L1049 ↗
21. 10.1016/S0040-6090(01)00758-110.1016/S0040-6090(01)00758-1 ↗
22. 10.1143/JJAP.36.170310.1143/JJAP.36.1703 ↗
23. 10.7567/APEX.11.07550210.7567/APEX.11.075502 ↗
24. 10.1088/0022-3727/23/7/03410.1088/0022-3727/23/7/034 ↗
25. 10.1016/S0927-0248(97)00132-310.1016/S0927-0248(97)00132-3 ↗
26. 10.1016/j.tsf.2004.11.03910.1016/j.tsf.2004.11.039 ↗
27. 10.1016/0022-3697(69)90169-310.1016/0022-3697(69)90169-3 ↗
28. 10.7567/JJAPS.32S3.16810.7567/JJAPS.32S3.168 ↗
29. 10.1016/j.jpcs.2005.09.06710.1016/j.jpcs.2005.09.067 ↗
30. 10.1016/j.jallcom.2009.08.14110.1016/j.jallcom.2009.08.141 ↗
31. 10.1143/JJAP.49.04DP0710.1143/JJAP.49.04DP07 ↗
32. 10.7567/JJAPS.32S3.59310.7567/JJAPS.32S3.593 ↗
33. 10.1063/1.130585810.1063/1.1305858 ↗
34. 10.1063/1.35924710.1063/1.359247 ↗
35. 10.1016/j.tsf.2011.02.03010.1016/j.tsf.2011.02.030 ↗
36. 10.1063/1.35512910.1063/1.355129 ↗
37. 10.1063/1.147696610.1063/1.1476966 ↗
38. 10.1063/1.149999010.1063/1.1499990 ↗
39. 10.1016/j.jcrysgro.2008.09.13510.1016/j.jcrysgro.2008.09.135 ↗
40. 10.35848/1347-4065/ac48cf10.35848/1347-4065/ac48cf ↗
41. 10.1021/acsami.0c1765910.1021/acsami.0c17659 ↗
42. 10.1038/s41467-020-17434-810.1038/s41467-020-17434-8 ↗
43. 10.1063/1.164675810.1063/1.1646758 ↗
44. 10.1038/nmat378910.1038/nmat3789 ↗
45. 10.1002/pssr.20160019910.1002/pssr.201600199 ↗
46. 10.1002/pip.224410.1002/pip.2244 ↗
47. 10.1021/acs.jpcc.8b0007910.1021/acs.jpcc.8b00079 ↗
48. 10.1002/aenm.20110076410.1002/aenm.201100764 ↗
49. 10.1063/1.502080510.1063/1.5020805 ↗
50. 10.1021/acs.jpcc.9b0604210.1021/acs.jpcc.9b06042 ↗
51. 10.1002/adfm.20200104610.1002/adfm.202001046 ↗
52. Rockett A. · Thin Solid Films · 2005 · 2 · 480
53. 10.1063/1.37053410.1063/1.370534 ↗
54. 10.1002/aenm.20160119110.1002/aenm.201601191 ↗
55. 10.1021/acs.jpcc.7b0308310.1021/acs.jpcc.7b03083 ↗
56. 10.1016/j.cogsc.2017.02.00110.1016/j.cogsc.2017.02.001 ↗
57. 10.1021/acsami.0c2053910.1021/acsami.0c20539 ↗
58. 10.1021/jacs.2c0628310.1021/jacs.2c06283 ↗
59. 10.1063/1.238825610.1063/1.2388256 ↗
60. 10.1107/S056773947600155110.1107/S0567739476001551 ↗
61. 10.1063/1.345616110.1063/1.3456161 ↗
62. 10.1063/1.479906410.1063/1.4799064 ↗
63. 10.1002/admi.20220126610.1002/admi.202201266 ↗
64. 10.1016/j.solmat.2020.11050210.1016/j.solmat.2020.110502 ↗
65. 10.1063/1.37190310.1063/1.371903 ↗
66. 10.1063/1.146762110.1063/1.1467621 ↗
67. 10.1002/pip.51810.1002/pip.518 ↗
68. 10.1063/1.35990110.1063/1.359901 ↗
69. 10.1016/j.tsf.2016.08.02110.1016/j.tsf.2016.08.021 ↗
70. 10.1021/acsami.5b0923110.1021/acsami.5b09231 ↗
71. 10.1038/nmat312210.1038/nmat3122 ↗
72. 10.1002/pip.296210.1002/pip.2962 ↗
73. 10.7567/APEX.10.09230110.7567/APEX.10.092301 ↗
74. 10.1063/1.503189810.1063/1.5031898 ↗
75. 10.1103/PhysRevApplied.15.05400510.1103/PhysRevApplied.15.054005 ↗
76. 10.1063/1.236299110.1063/1.2362991 ↗