Probing Charge Recombination Dynamics in Organic Photovoltaic Devices under Open‐Circuit Conditions
Source abstract
Abstract
Large perturbation transient photovoltage and impedance spectroscopy measurements are used to gain insights into recombination in organic photovoltaic devices. The combination of these two simple optoelectronic techniques enables characterization of recombination order as well as mobile and trapped charge evolution over a large range of carrier densities. The data show that trapped charge is approximately equal to total charge at low carrier densities in the high efficiency devices measured. Between low and high charge carrier density, the order of recombination is observed to vary from monomolecular to bimolecular to higher order. The new techniques and methods presented can be applied to any type of photovoltage device to gain insight into device operation and limitations.
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Research context
OpenAlex topics: Organic Electronics and Photovoltaics · Silicon and Solar Cell Technologies · Molecular Junctions and Nanostructures
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
Materials Science and Engineering Division, Material Measurement Laboratory, NIST 100 Bureau Drive Gaithersburg MD 20899–8541 USA
Semiconductor and Dimensional Metrology Division, Physical Measurement Laboratory, NIST 100 Bureau Drive Gaithersburg MD 20899–8120 USA
Department of Electrical Engineering Penn State University University Park PA 16802 USA
Institute of Computational Physics Zurich University of Applied Sciences, ZHAW Technikumstrasse 9 8401 Winterthur Switzerland
Department of Electrical and Computer Engineering Old Dominion University Norfolk VA 23529 USA
Funding
National Research Council · NIST-ARRA Fellowship Program · University of Maryland
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