Direct Visualization of Charge Migration in Bilayer Tantalum Oxide Films by Multimodal Imaging (Adv. Electron. Mater. 1/2024)
Source abstract
Abstract
Memristive Mechanisms In article number 2300589, Olga S. Ovchinnikova and co-workers image charge trapping and ionic motion with multimodal imaging techniques to elucidate the mechanisms that drive reversable resistive switching in amorphous Ta2O5/Ta/TiN films. In-situ conductive-AFM and secondary ion mass spectrometry are utilized, along with complementary ion beam irradiation, to visualize oxygen motion within the active layers.
Source: openalex_inverted_index · Quality: baseline
Research context
OpenAlex topics: Ion-surface interactions and analysis · Advanced Memory and Neural Computing
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Affiliations
Department of Materials Science & Engineering University of Tennessee Knoxville 37916 TN USA
Center for Nanophase Materials Sciences Oak Ridge 37830 TN USA
Neutron Scattering Division Oak Ridge 37830 TN USA
Sandia National Laboratory Livermore 94551 CA USA
Department of Electrical Computer and Energy Engineering Arizona State University Tempe 58287 Arizona USA
References
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