Effects of the Helmholtz Layer Capacitance on the Potential Distribution at Semiconductor/Electrolyte Interface and the Linearity of the Mott‐Schottky Plot
Source abstract
Abstract
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Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Force Microscopy Techniques and Applications · Electrochemical Analysis and Applications · Surface and Thin Film Phenomena
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Affiliations
Department of Chemistry, Faculty of Science, Hokkaido University, Sapporo 060, Japan
References
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