journal article·1979-03-01

Semiconductor Properties of Iron Oxide Electrodes

S. M. Wilhelm, K. S. Yun, L. W. Ballenger, N. Hackerman

Publisher page

Abstract

The semiconductor electrode properties of thermally grown iron oxide and anodic oxide films on iron are compared. The bandgaps are 2.1 and 1.9 eV, respectively. Donor densities and flatband potentials are reported. Measurement of the currents produced by chopped illumination has allowed evaluation of electrode parameters and determination of reaction pathways.
Source: openalex_inverted_index · Quality: baseline

Research context

OpenAlex topics: Iron oxide chemistry and applications · Electrochemical Analysis and Applications · Corrosion Behavior and Inhibition

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Affiliations

Department of Chemistry, Rice University, Houston, Texas 77001

References

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