On the Interpretation of Mott‐Schottky Plots Determined at Semiconductor/Electrolyte Systems
Source abstract
Abstract
Abstract not Available.
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Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Surface and Thin Film Phenomena
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
Rijksuniversiteit Gent, Laboratorium voor Kristallografie en Studie van de Vaste Stof, Krijgslaan 271, B‐9000 Gent, Belgium
References
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