Interface diagnostics: In-situ determination of crystal-melt interface shape evolutions via probing growth interface electromotive force
Source abstract
Abstract
Detecting crystal-melt interface shape during growth is critical to understanding boundary phase-change kinetics and manufacturing high-quality bulk crystalline materials. However, even for the widely used Czochralski system, the detection of this blind spot has not yet been realized. Here, we determine the interface shape evolution in situ by analyzing the correlation between the growth interface electromotive force (GEMF) and seed crystal temperature of a growing boule. Due to the direct response of GEMF to interface thermal behavior, our determinations show good agreement with computational simulations and experimental as-grown boules. On this basis, it is possible to trace the real-time kinetics of crystallization and provide quantitative interface feedback, which help reveal boundary heat and mass transfer, optimize growth conditions, and hence improve crystal quality. This GEMF-based feedback mechanism will be applied to other directional solidification methods for preventing interface instability and homogenizing component distribution in oxide, semiconductor, and metal crystalline materials.
Source: expertdata · Quality: candidate unverified · Source record ↗
Research context
OpenAlex topics: Solidification and crystal growth phenomena · Phase-change materials and chalcogenides · Shape Memory Alloy Transformations
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
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