journal article·2015-09-03

Electron Injection Dynamics at the SILAR Deposited CdS Quantum Dot/TiO2 Interface

Ryosuke Nakamura, Satoshi Makuta, Yasuhiro Tachibana

The Journal of Physical Chemistry C· Volume 119· Issue 35
Publisher page

Abstract

Semiconductor quantum dots with their tunable band gap energies offer new opportunities for controlling photoresponse and photoconversion efficiency of solar cells. Exciton dissociation, charge injection, and charge recombination are key steps for efficient interfacial electron transfer. Here, electron injection and carrier relaxation dynamics at the CdS quantum dot/TiO 2 interface were investigated by using ultrafast transient absorption spectroscopy and global fitting analyses. The CdS/TiO 2 composites were prepared by depositing CdS in the TiO 2 nanocrystalline films by the successive ionic layer adsorption and reaction (SILAR) technique. Comparing the transient absorption spectra of CdS/TiO 2 composites formed by different numbers of CdS coating cycles and CdS/Al 2 O 3 revealed size-dependent electron injection from excited CdS into TiO 2 nanoparticles, which occurred on a time scale of 1–9 ps. We also demonstrated that holes are trapped in a localized state with a time constant of 0.3 ps, which was faster than the electron trapping with a time constant of about 30 ps.
Source: openalex_inverted_index · Quality: baseline

Research context

OpenAlex topics: Quantum Dots Synthesis And Properties · Chalcogenide Semiconductor Thin Films · Electronic and Structural Properties of Oxides

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

Science and Technology Entrepreneurship Laboratory, Office for University-Industry Collaboration, Osaka University, 2-1 Yamada-oka, Suita, Osaka 565-0871, Japan

School of Aerospace, Mechanical and Manufacturing Engineering, RMIT University, Bundoora, VIC 3083, Australia

Japan Science and Technology Agency (JST), PRESTO, 4-1-8 Honcho Kawaguchi, Saitama 332-0012, Japan

Funding

Japan Science and Technology Agency

References (30)

Show source-provided references
1. 10.1103/PhysRevB.53.146310.1103/PhysRevB.53.1463 ↗
2. 10.1006/spmi.1996.009510.1006/spmi.1996.0095 ↗
3. 10.1021/jp980387g10.1021/jp980387g ↗
4. 10.1021/jp012458910.1021/jp0124589 ↗
5. 10.1063/1.144685110.1063/1.1446851 ↗
6. 10.1063/1.9722510.1063/1.97225 ↗
7. 10.1103/PhysRevLett.65.162310.1103/PhysRevLett.65.1623 ↗
8. 10.1103/PhysRevLett.70.101410.1103/PhysRevLett.70.1014 ↗
9. 10.1103/PhysRevLett.96.05740810.1103/PhysRevLett.96.057408 ↗
10. 10.1103/PhysRevLett.98.17740310.1103/PhysRevLett.98.177403 ↗
11. 10.1103/PhysRevB.60.1374010.1103/PhysRevB.60.13740 ↗
12. 10.1021/jp808291u10.1021/jp808291u ↗
13. 10.1021/jp102101f10.1021/jp102101f ↗
14. 10.1063/1.356106310.1063/1.3561063 ↗
15. 10.1021/jp036677110.1021/jp0366771 ↗
16. 10.1021/j100379a05110.1021/j100379a051 ↗
17. 10.1063/1.46837610.1063/1.468376 ↗
18. 10.1016/0009-2614(90)85339-E10.1016/0009-2614(90)85339-E ↗
19. 10.1021/j100063a02210.1021/j100063a022 ↗
20. 10.1246/cl.2007.8810.1246/cl.2007.88 ↗
21. 10.1021/acs.jpclett.5b0076510.1021/acs.jpclett.5b00765 ↗
22. 10.1021/jp809042z10.1021/jp809042z ↗
23. 10.1021/jp709906410.1021/jp7099064 ↗
24. 10.1021/jp508833810.1021/jp5088338 ↗
25. 10.1021/ja303306u10.1021/ja303306u ↗
26. 10.1021/ja00263a00510.1021/ja00263a005 ↗
27. 10.1021/j100327a03010.1021/j100327a030 ↗
28. 10.1016/0009-2614(89)87267-710.1016/0009-2614(89)87267-7 ↗
29. 10.1021/ja070099a10.1021/ja070099a ↗
30. 10.1039/C4CP04761C10.1039/C4CP04761C ↗