Radiation resistance of photodiodes based on indium monoselenides under γ-irradiation

Abstract The influence of γ-irradiation (E = 3 MeV) over a large dose range 0.14–140 kGy on the electrical and photoelectric parameters of p–n-InSe and intrinsic oxide–p-InSe photoconvertors has been investigated. The detected changes in current–voltage characteristics, photoresponse spectra, open-circuit voltage, and short-circuit current for the structures are explained by the formation of radiation-induced point defects. A comparison to silicon photodiodes irradiated at analogous conditions has been carried out. On the basis of the absence of essential changes of the characteristics of the homo- and hetero-junctions based on III–VI layered semiconductors even at the maximum irradiation doses these junctions are recommended as radiation-resistant photodetectors for operation under γ-irradiation.