Impurities in liquid semiconductors, studied by TDPAD technique

A. Draijer; M.A. Haghani; M. von Hartrott; K. Ott; C.A. Paulick; D. Quitmann; B. Sauer

doi:10.1016/0022-3093(87)90308-5

journal article·1987-12

Impurities in liquid semiconductors, studied by TDPAD technique

A. Draijer, M.A. Haghani, M. von Hartrott, K. Ott, C.A. Paulick, D. Quitmann, B. Sauer

Journal of Non-Crystalline Solids· Volume 97-98

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Electronic materials

OpenAlex topics: Thermodynamic and Structural Properties of Metals and Alloys · Theoretical and Computational Physics · Rare-earth and actinide compounds

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References (24)

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