journal article·1991

Noise characterisation studies of amorphous semiconductors

R.P. Barclay, J.M. Boud

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Abstract

No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.

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Research context

OpenAlex topics: Thin-Film Transistor Technologies · Force Microscopy Techniques and Applications · Silicon Nanostructures and Photoluminescence

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References (14)

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