Neutron diffraction of liquid arsenic–tellurium mixtures near the semiconductor–metal transition
Source abstract
Abstract
Abstract Neutron scattering measurements have been carried out for liquid As–Te mixtures containing 10, 20 and 30 at.% As in the temperature range between 400 and 600 °C. The local structure was analyzed by combining the information available from our previous EXAFS results. The partial coordination number for As–Te, n As–Te , for the mixture containing 20 at.% As decreases from 3.0–2.5 at 400 °C to 2.0–1.7 at 600 °C, suggesting that a `network-chain' structural transformation occurs on the semiconductor to metal transition at high temperature. We propose that the first sharp diffraction peak observed around 1.4 A −1 in S ( Q ) indicates the presence of small chain clusters. It is found that the position of the second peak of g ( r ) shifts to smaller r at high temperature, which leads to volume contraction.
Source: openaire · Quality: candidate unverified · Source record ↗
Research context
OpenAlex topics: Phase-change materials and chalcogenides · Chemical Thermodynamics and Molecular Structure · Chalcogenide Semiconductor Thin Films
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References (4)
Show source-provided references
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