journal article·1987-12

Relation between system parameters and measured drift mobilities in amorphous semiconductors

Guy J. Adriaenssens, Geert Seynhaeve

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OpenAlex topics: Theoretical and Computational Physics · Material Dynamics and Properties · Optical properties and cooling technologies in crystalline materials

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References (8)

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1. Marshall · Solid State Commun. · 1985 · 54 · 1110.1016/0038-1098(85)91022-1 ↗
2. Michiel · Phys. Rev. B · 1986 · 34 · 248010.1103/PhysRevB.34.2486 ↗
3. Marshall · Phil. Mag. B · 1986 · 54 · 5110.1080/13642818608243177 ↗
4. Silver · J. Appl. Phys. · 1986 · 59 · 350310.1063/1.336821 ↗
5. Michiel · Phil. Mag. B · 1985 · 51 · 2710.1080/01418618508242764 ↗
6. Seynhaeve · Solid State Commun. · 1985 · 56 · 32310.1016/0038-1098(85)90394-1 ↗
7. G. Seynhaeve, G.J. Adriaenssens, H. Michiel and H. Overhof, to be published.
8. Tiedje · Phys. Rev. Lett. · 1981 · 46 · 142510.1103/PhysRevLett.46.1425 ↗