Meta-stable changes in the output characteristics of high-voltage amorphous silicon thin-film transistors
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Abstract
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Research context
OpenAlex topics: Thin-Film Transistor Technologies · Advancements in Semiconductor Devices and Circuit Design · Semiconductor materials and devices
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References (6)
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1. Tuan · 1986 · 70 · 651
2. Hack · 1987 · 95 · 457
3. Martin · IEDM · 1987 · 87 · 440
4. Degradation of high and low voltage amorphous silicon thin-film transistors due to air leak
5. Shaw · J. Appl. Phys. · 1988 · 65 · 456210.1063/1.341258 ↗
6. Shaw · J. Appl. Phys. · 1989