Leakage current reduction due to hot carrier effects in n-channel polycrystalline silicon thin film transistors
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Abstract
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Research context
OpenAlex topics: Thin-Film Transistor Technologies · Semiconductor materials and devices · Advancements in Semiconductor Devices and Circuit Design
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References (10)
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9. Schwerin · IEEE Trans. Electron Dev. · 1987 · 34 · 249310.1109/T-ED.1987.23340 ↗
10. Lai · Appl. Phys. Lett. · 1981 · 39 · 5810.1063/1.92514 ↗