A study of amorphous semiconductor interfaces by spectroscopic ellipsometry
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Abstract
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Research context
OpenAlex topics: Thin-Film Transistor Technologies · Silicon Nanostructures and Photoluminescence · Silicon and Solar Cell Technologies
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References (6)
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1. Aspnes · J. Electrochem. Soc. · 1980 · 127 · 135910.1149/1.2129899 ↗
2. Aspnes · 1981 · 276 · 188
3. Aspnes · J. Opt. Soc. Am. · 1975 · 64 · 81210.1364/JOSA.64.000812 ↗
4. Aspnes · Phys. Rev. B · 1984 · 29 · 76810.1103/PhysRevB.29.768 ↗
5. R.W. Collins, W.J. Biter, H. Windischmann, and A.H. Clark, Thin Solid Films, in press.
6. R.W. Collins, C.J. Tuckerman, C.-Y. Huang, and H. Windischmann, unpublished.