Influence of the oxide charge build-up during Fowler-Nordheim stress on the current-voltage characteristics of metal-oxide-semiconductor capacitors
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OpenAlex topics: Semiconductor materials and devices · Advancements in Semiconductor Devices and Circuit Design · Integrated Circuits and Semiconductor Failure Analysis
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References (9)
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9. DiMaria · J. Appl. Phys. · 1993 · 73 · 336710.1063/1.352936 ↗