X-ray diffraction measurement of liquid As2Se3 by using third-generation synchrotron radiation

Abstract X-ray diffraction (XD) measurements of liquid As 2 Se 3 were carried out in the temperature range up to 1600 °C where the temperature is well beyond the semiconductor to metal (SC–M) transition temperature around 1000 °C. The measurements were done by using third-generation synchrotron radiation at SPring-8 and the obtained structure factors have been much improved compared to previous in house XD measurements with regard to the momentum transfer range and the data statistics. The deduced pair distribution functions show that with increasing temperature, the position of the first peak does not change within the errorbar and the coordination number gradually decreases up to 1600 °C irrespective of the SC–M transition. These results coincide with those of the first-principle molecular dynamics simulation.