Variation of semiconductor properties through the SiOx region of Si SiO2 interfaces
Bibliographic record
Abstract
No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.
Source: Not provided · Quality: missing
Research context
OpenAlex topics: Silicon Nanostructures and Photoluminescence · Thermography and Photoacoustic Techniques
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (10)
Show source-provided references
1. Hübner · 1979 · 10
2. Hübner · 1978 · 111
3. H.G. Neumann, R. Engelke, and K. Hübner, to be published.
4. Hübner · phys. stat. sol. (a) · 1979 · 53 · K7910.1002/pssa.2210530171 ↗
5. Hübner · phys. stat. sol. (a) · 1977 · 42 · 50110.1002/pssa.2210420211 ↗
6. Bechstedt · phys. stat. sol. (b) · 1979 · 91 · 16710.1002/pssb.2220910117 ↗
7. K. Hübner and F. Bechstedt, phys. stat. sol. (b), in the press.
8. G. Zuther, K. Hübner, and E. Rogmann, Thin Solid Films, in the press.
9. Hübner · phys. stat. sol. (a) · 1979 · 52 · 54110.1002/pssa.2210520222 ↗
10. Hübner · phys. stat. sol. (b) · 1979 · 9410.1002/pssb.2220940148 ↗