journal article·2002-04

Measurement of the thermo-optic coefficient of a-Si:H at the wavelength of 1500 nm from room temperature to 200 °C

G Cocorullo, F.G Della Corte, L Moretti, I Rendina, A Rubino

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Abstract

Abstract The thermo-optic coefficient (TOC) of hydrogenated amorphous silicon (a-Si:H) has been measured in the temperature range 30–200 °C, at the communication wavelength of 1.55 μm . The experimental data have been fitted using a single oscillator model that takes into account the shape of e2-spectrum of the amorphous semiconductor. The extracted parameters significantly extend, and are consistent with, the few data reported in the literature. An interesting analogy with crystalline silicon (c-Si) is also found and discussed.
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Research context

OpenAlex topics: Thin-Film Transistor Technologies · Phase-change materials and chalcogenides · Glass properties and applications

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References (13)

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