Low frequency noise characterization of 0.25 μm Si CMOS transistors
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Research context
OpenAlex topics: Advancements in Semiconductor Devices and Circuit Design · Semiconductor materials and devices · Integrated Circuits and Semiconductor Failure Analysis
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References (11)
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1. Kirton · Adv. Phys. · 1989 · 38 · 36710.1080/00018738900101122 ↗
2. Chang · IEEE Trans Electron Dev. · 1994 · 41 · 196510.1109/16.333812 ↗
3. G. Ghibaudo, O. Roux dit Buisson, Proc. of ESSDERC 94, ed. C. Hill, P. Ashburn (Les Editions Frontières) p. 693.
4. G. Ghibaudo, J. Brini, J. Zimmerman, G. Kamarinos, Proc. of ICNF 95, ed. V. Bareikis and R. Katilius, (World Scientific) p. 404.
5. Wolf · 1990
6. Ghibaudo · Electron. Lett. · 1988 · 24 · 54310.1049/el:19880369 ↗
7. Characterization methods for submicronmeter MOSFET's
8. Hooge · Physica · 1976 · 83B · 14
9. Roux dit Buisson · 1993
10. Ghibaudo · Phys. Status Solidi · 1991 · a)124 · 57110.1002/pssa.2211240225 ↗
11. Roux dit Buisson · Solid State Electron. · 1992 · 35 · 127310.1016/0038-1101(92)90161-5 ↗