Source abstract
Abstract
Due to structural imperfection and indium content fluctuation, carriers’ localization in an InGaN-based active layer can produce efficient luminescence and unusual thermodynamic behaviors. Spectral features associated with localization, such as the “S-shaped” shift of peak energy in temperature-dependent photoluminescence (PL) and the nonexponential decay in time-resolved photoluminescence (TRPL), have not yet formed a comprehensive physical interpretation. In this work, the thermal evolution of carriers’ decay process is examined by spectroscopic approaches in high-efficiency InGaN/GaN multiple quantum well (MQW) samples. Based on the localized-state ensemble model, the peak shift in temperature-dependent PL is excellently fitted by the “red” and “blue” localization centers, which perfectly match with the fast and slow processes resolved from TRPL using biexponential model. All variations in emission peak, line shape, filling position, and lifetime with temperature are elucidated by carriers redistributing between two kinds of localization centers according to the density of states. Meanwhile, the impact of substrate and underlying layers in MQW samples has also been compared. Through such systematic analysis, the dynamics of carriers in MQWs have been quantitatively discussed, and a comprehensive understanding on the localization-induced luminescence mechanism is achieved.
Source: openalex_inverted_index · Quality: baseline
Affiliations
Tsinghua National Laboratory for Information Science and Technology, Department of Electronic Engineering, Tsinghua University, Beijing 100084, China
Funding
Ministry of Science and Technology of the People's Republic of China · Tsinghua University · State Key Laboratory on Integrated Optoelectronics, Tsinghua University · Beijing Municipal Commission of Science and Technology · Collaborative Innovation Center of Solid-State Lighting and Energy-Saving Electronics · Science Challenge Project · CAEP Microsystem and THz Science and Technology Foundation