Imaging Electron Beam-Sensitive Twisted Hybrid Perovskite Bilayers at One-Angstrom Resolution
Source abstract
Abstract
Twisted halide perovskite bilayers, a type of moiré material, show square moiré patterns with exciting optical properties. Atomic-scale structure analysis and its correlation with properties are difficult to achieve due to the extreme sensitivity of organic–inorganic halide perovskites to the illuminated electron beam in conventional/scanning transmission electron microscopy. Here, we developed a low-dose exit wave reconstruction methodology with a real-space resolution of one angstrom at ∼50 e/Å 2, which recovers the phase information on the moiré fringes in CH 3 NH 3 PbI 3 (MAPbI 3 ) twisted perovskite bilayers at atomic scale, enabling detailed structural analysis of defects and corresponding strain distribution in such moiré materials. This work provides an atomic-level understanding of electron beam-sensitive twisted bilayer materials.
Source: openalex_inverted_index · Quality: baseline
Research context
OpenAlex topics: Perovskite Materials and Applications · Magnetic and transport properties of perovskites and related materials · Electronic and Structural Properties of Oxides
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
School of Physical Science and Technology
ShanghaiTech University
Shanghai Key Laboratory of High-Resolution Electron Microscopy
Key Laboratory of Precision and Intelligent Chemistry, Department of Materials Science and Engineering, School of Chemistry and Materials Science
University of Science and Technology of China
Department of Chemistry
Purdue University
Davidson School of Chemical Engineering
Birck Nanotechnology Center
Funding
Basic Energy Sciences · Fundamental Research Funds for the Central Universities · ShanghaiTech University · National Natural Science Foundation of China
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