Scanning Moiré Fringe Method: A Superior Approach to Perceive Defects, Interfaces, and Distortion in 2D Materials
Abstract
Research context
OpenAlex topics: Electronic and Structural Properties of Oxides · Non-Destructive Testing Techniques · Ga2O3 and related materials
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Affiliations
Nanomaterials Research Institute, National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba 305-8565, Japan
Interdisciplinary Graduate School of Engineering Sciences, Kyushu University, Fukuoka 816-8580, Japan
Information and Communications Research Laboratories, Industrial Technology Research Institute, Hsinchu 31040, Taiwan
Institute of Communication Engineering, National Chiao Tung University, Hsinchu 30010, Taiwan
Department of Electrical Engineering, National Tsing Hua University, Hsinchu 30013, Taiwan
Innovative Functional Materials Research Institute, National Institute of Advanced Industrial Science and Technology (AIST), Nagoya 463-8560, Japan
Department of Materials Science and Engineering and Research Institute of Advanced Materials, Seoul National University, Seoul 151-742, Republic of Korea
Global Innovation Center (GIC), Kyushu University, Fukuoka 816-8580, Japan
Funding
Ministry of Science and Technology · Core Research for Evolutional Science and Technology · Japan Society for the Promotion of Science · National Research Foundation · Kazato Research Encouragement Prize