Chemical Imprinting of Crystalline Silicon with Catalytic Metal Stamp in Etch Bath
Source abstract
Abstract
Conventional lithography using photons and electrons continues to evolve to scale down three-dimensional nanoscale patterns, but the complexity of technology and equipment is increasing due to diffraction and scattering problems. Physical contact lithography methods, such as nanoimprint and soft lithography, have been developed as an alternative technique. These techniques imprint predefined structures on a stamp to the polymer resist and use the polymer resist as a mask to dry etch the nanostructure on the substrate. In this study, we introduce a method of chemically imprinting crystalline silicon (Si) with a catalytic stamp to enable the direct etching of the Si without using a polymer mask. A metal catalyst is deposited on the predefined structure of the stamp. The stamp physically contacts the Si in the etching bath, and metal-assisted chemical etching occurs on the semiconductor surface. Since the metal catalyst is mounted on a stamp, it can be used repeatedly. This is a technology that combines conventional lithography and etching without using a polymer resist. This technology not only produced nano/microscale arrays of circular and square holes and trench structures but also successfully produced complex eagle-shaped structures that contained such structures.
Source: openalex_inverted_index · Quality: baseline
Research context
OpenAlex topics: Nanofabrication and Lithography Techniques · Nanowire Synthesis and Applications · Advanced Surface Polishing Techniques
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
School of Integrated Technology, Yonsei University, Incheon 21983, Republic of Korea
Yonsei Institute of Convergence Technology, Incheon 21983, Republic of Korea
Department of Chemistry, Ulsan National Institute of Science and Technology (UNIST), Ulsan 44919, Republic of Korea
Funding
National Research Foundation of Korea · Ministry of Science, ICT and Future Planning
References (42)
Show source-provided references
1. 10.1147/rd.462.021310.1147/rd.462.0213 ↗
2. Bin, Y.; Leland, C.; Ahmed, S.; Haihong, W.; Bell, S.; Chih-Yuh, Y.; Tabery, C.; Chau, H.; Qi, X.; Tsu-Jae, K.;InFinFET Scaling to 10 nm Gate Length; Digest. International Electron Devices Meeting, 2002; pp251–254.
3. 10.1016/j.sse.2003.12.02010.1016/j.sse.2003.12.020 ↗
4. Lin, C.H.; Chang, J.; Guillorn, M.; Bryant, A.; Oldiges, P.; Haensch, W.InNon-Planar Device Architecture for 15nm Node: FinFET or Trigate? SOI Conference (SOI); 2010 IEEE International,IEEE, 2010; pp1–2.10.1109/SOI.2010.5641060 ↗
5. 10.1109/LED.2016.257704610.1109/LED.2016.2577046 ↗
6. Bjorkholm J. E. · Intel Technol. J. · 1998 · 3 · 98
7. 10.1038/nphoton.2009.25110.1038/nphoton.2009.251 ↗
8. 10.1038/nphoton.2014.21410.1038/nphoton.2014.214 ↗
9. 10.1109/TEPM.2003.81771410.1109/TEPM.2003.817714 ↗
10. 10.1021/nl304715p10.1021/nl304715p ↗
11. 10.1016/j.mee.2015.02.04210.1016/j.mee.2015.02.042 ↗
12. 10.1116/1.58860510.1116/1.588605 ↗
13. 10.1021/nl062766o10.1021/nl062766o ↗
14. 10.1088/0957-4484/22/15/15530210.1088/0957-4484/22/15/155302 ↗
15. 10.1038/nnano.2014.15710.1038/nnano.2014.157 ↗
16. 10.1002/adma.20060088210.1002/adma.200600882 ↗
17. 10.1186/1556-276X-9-32010.1186/1556-276X-9-320 ↗
18. 10.1038/nature0969710.1038/nature09697 ↗
19. 10.1146/annurev.matsci.28.1.15310.1146/annurev.matsci.28.1.153 ↗
20. 10.1021/la020169l10.1021/la020169l ↗
21. 10.1016/S1369-7021(05)00702-910.1016/S1369-7021(05)00702-9 ↗
22. 10.1038/nprot.2009.23410.1038/nprot.2009.234 ↗
23. 10.1063/1.131919110.1063/1.1319191 ↗
24. 10.1002/adma.20100178410.1002/adma.201001784 ↗
25. 10.1088/0957-4484/24/22/22530510.1088/0957-4484/24/22/225305 ↗
26. 10.1063/1.483165710.1063/1.4831657 ↗
27. 10.1021/nl202708d10.1021/nl202708d ↗
28. 10.1021/nn200345810.1021/nn2003458 ↗
29. 10.1039/C4TA05095A10.1039/C4TA05095A ↗
30. 10.1039/C5CP07863F10.1039/C5CP07863F ↗
31. 10.1039/C4TA02189D10.1039/C4TA02189D ↗
32. 10.1021/nl504136c10.1021/nl504136c ↗
33. 10.1002/adfm.20160561410.1002/adfm.201605614 ↗
34. 10.1021/nl903841a10.1021/nl903841a ↗
35. 10.1021/jp303422710.1021/jp3034227 ↗
36. 10.1002/adfm.20150515310.1002/adfm.201505153 ↗
37. 10.1039/C7NR01777D10.1039/C7NR01777D ↗
38. 10.1039/C6SC04091H10.1039/C6SC04091H ↗
39. 10.1016/j.elecom.2016.12.00410.1016/j.elecom.2016.12.004 ↗
40. 10.1016/j.elecom.2017.01.01410.1016/j.elecom.2017.01.014 ↗
41. 10.1039/C5RA15745E10.1039/C5RA15745E ↗
42. 10.1116/1.57658310.1116/1.576583 ↗