journal article·2023-05-01Open access

Influence of annealing on the properties of chemically prepared SnS thin films

Department of Physics, Govt.Victoria College (affiliated to University of Calicut) Palakkad Kerala 678001, India, S. John, M. Francis, Department of Physics, Mercy College (affiliated to University of Calicut) Palakkad Kerala 678006, India, A. P. Reena Mary, Department of Physics, Govt.Victoria College (affiliated to University of Calicut) Palakkad Kerala 678001, India, V. Geetha, Department of Physics, Govt.Victoria College (affiliated to University of Calicut) Palakkad Kerala 678001, India

Chalcogenide Letters· Volume 20· Issue 5

Abstract

Thin films of SnS were deposited chemically, and they are annealed at four different temperatures: 100 °C, 150 °C, 200 °C, and 250 °C. X-ray diffraction, Raman analysis, UV-visible spectroscopy, field emission scanning electron microscopy, and energy dispersive spectroscopy were used to investigate the impact of annealing temperature on the structural, optical, morphological, and chemical properties of thin films. As the annealing temperature rose, it was seen from the XRD patterns that the crystallinity of SnS films improved. At 250 °C, the film was almost evaporated, and the XRD pattern showed no peaks at all. The lattice strain and crystallite size were computed from the WilliamsonHall plots. The crystallite size increased and the lattice strain decreased with the increase in the annealing temperature. According to optical investigations, the samples' optical bandgap shrank as the annealing temperature rose. Morphological studies showed the formation of well-adhered films, and as the annealing temperature increased, the film became denser and more continuous with larger grains. The atomic weight percentage of sulphur decreased as the annealing temperature increased, according to the EDS analysis. Photovoltaic structures with the configuration ITO/SnS/CdS/Ag were fabricated. From the I-V characteristics, it was observed that the cell structure formed with SnS annealed at 200 °C showed better cell performance.
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Research context

OpenAlex topics: Quantum Dots Synthesis And Properties · Chalcogenide Semiconductor Thin Films · Copper-based nanomaterials and applications

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References (29)

Show source-provided references
1. [1] J. Y. Cho et al., Journal of Materials Chemistry A 8(39), 20658 (2020).
2. [2] J. A. Andrade-Arvizu, M. Courel-Piedrahita, O. Vigil-Galán, Journal of Materials Science: Materials in Electronics 26(7) , 4541 (2015); https://doi.org/10.1007/s10854-015-3050-z10.1007/s10854-015-3050-z ↗
3. [3] B. Singh, J. Singh, J. Kaur, R. K. Moudgil, S. K. Tripathi, Physica B: Condensed Matter 490, 49 (2016); https://doi.org/10.1016/j.physb.2016.03.00610.1016/j.physb.2016.03.006 ↗
4. [4] M. Ganchev, P. Vitanov, M. Sendova-Vassileva, G. Popkirov, H. Dikov, Journal of Physics: Conference Series 682(1) (2016); https://doi.org/10.1088/1742-6596/682/1/01201910.1088/1742-6596/682/1/012019 ↗
5. [5] K. Hartman et al., Thin Solid Films 519(21) , 7421 (2011); https://doi.org/10.1016/j.tsf.2010.12.18610.1016/j.tsf.2010.12.186 ↗
6. [6] B. S. Moon, J. H. Lee, H. Jung, Thin Solid Films 511-512 , 299 (2006); https://doi.org/10.1016/j.tsf.2005.11.08010.1016/j.tsf.2005.11.080 ↗
7. [7] S. Mlowe et al., New Journal of Chemistry 38(12) , 6073 (2014); https://doi.org/10.1039/C4NJ01201A10.1039/C4NJ01201A ↗
8. [8] I. Y. Ahmet, M. S. Hill, A. L. Johnson, L. M. Peter, Chemistry of Materials 27(22) , 7680 (2015); https://doi.org/10.1021/acs.chemmater.5b0322010.1021/acs.chemmater.5b03220 ↗
9. [9] B. Altiokka, A. K. Yildirim, Journal of the Korean Physical Society 72(6) , 687 (2018); https://doi.org/10.3938/jkps.72.68710.3938/jkps.72.687 ↗
10. [10] R. Mariappan, T. Mahalingam, V. Ponnuswamy, Optik 122(24) , 2216 (2011); https://doi.org/10.1016/j.ijleo.2011.01.01510.1016/j.ijleo.2011.01.015 ↗
11. [11] J. Johny, S. Sepulveda-Guzman, B. Krishnan, D. A. Avellaneda, J. A. Aguilar Martinez, S. Shaji, ChemPhysChem 18(9) , 1061 (2017); https://doi.org/10.1002/cphc.20160118610.1002/cphc.201601186 ↗
12. [12] J. C. Orlianges, C. Champeaux, P. Dutheil, A. Catherinot, T. M. Mejean, Thin Solid Films 519(21) , 7611 (2011); https://doi.org/10.1016/j.tsf.2010.12.13910.1016/j.tsf.2010.12.139 ↗
13. [13] K. Santhosh Kumar, C. Manoharan, S. Dhanapandian, A. Gowri Manohari, Spectrochimica Acta - Part A: Molecular and Biomolecular Spectroscopy 115 , 840 (2013); https://doi.org/10.1016/j.saa.2013.06.11210.1016/j.saa.2013.06.112 ↗
14. [14] A. A. Aboud, A. Mukherjee, N. Revaprasadu, A. N. Mohamed, Journal of Materials Research and Technology 8(2) , 2021 (2019); https://doi.org/10.1016/j.jmrt.2018.10.01710.1016/j.jmrt.2018.10.017 ↗
15. [15] D. J. Desale et al., Adv. Appl. Sci. Res. 2(4) , 417 (2011).
16. [16] B. Ghosh, M. Das, P. Banerjee, S. Das, Applied Surface Science 254(20) , 6436 (2008); https://doi.org/10.1016/j.apsusc.2008.04.00810.1016/j.apsusc.2008.04.008 ↗
17. [17] H. Sattarian, T. Tohidi, S. Rahmatallahpur, Materials Science- Poland 34(3) , 540 (2016); https://doi.org/10.1515/msp-2016-007210.1515/msp-2016-0072 ↗
18. [18] U. Chalapathi, B. Poornaprakash, W. J. Choi, S. H. Park, Applied Physics A: Materials Science and Processing 126(8) , 1 (2020); https://doi.org/10.1007/s00339-020-03763-410.1007/s00339-020-03763-4 ↗
19. [19] S. John, V. Geetha, M. Francis, IOP Conference Series: Materials Science and Engineering 872(1) (2020); https://doi.org/10.1088/1757-899X/872/1/01213910.1088/1757-899X/872/1/012139 ↗
20. [20] M. S. Su, C. Y. Kuo, M. C. Yuan, U. S. Jeng, C. J. Su, K. H. Wei, Advanced Materials 23(29) , 3315 (2011); https://doi.org/10.1002/adma.20110127410.1002/adma.201101274 ↗
21. [21] T. Ben Nasr, N. Kamoun, M. Kanzari, R. Bennaceur, Thin Solid Films 500(1-2) , 4 (2006); https://doi.org/10.1016/j.tsf.2005.11.03010.1016/j.tsf.2005.11.030 ↗
22. [22] V. S. Raut, C. D. Lokhande, V. V Killedar, International Journal of Engineering Research and Technology 10(1) , 568 (2017). [Online]. Available: http://www.irphouse.com
23. [23] S. John, V. Geetha, AIP Conference Proceedings 2162(October) (2019).10.1063/1.5130348 ↗
24. [24] N. Kabiri Samani, Z. Dehghani Tafti, H. A. Bioki, M. B. Zarandi, S. Shayegh, Optik 131 , 231 (2017); https://doi.org/10.1016/j.ijleo.2016.08.12910.1016/j.ijleo.2016.08.129 ↗
25. [25] A. S. Hassanien, A. A. Akl, Physica B: Condensed Matter 473 , 11 (2015); https://doi.org/10.1016/j.physb.2015.05.02310.1016/j.physb.2015.05.023 ↗
26. [26] E. R. Shaaban, N. Afify, A. El-Taher, Journal of Alloys and Compounds 482(1-2) , 400 (2009); https://doi.org/10.1016/j.jallcom.2009.04.03310.1016/j.jallcom.2009.04.033 ↗
27. [27] V. R. Minnam Reddy, S. Gedi, C. Park, M. R.w, R. R. Ramakrishna, Current Applied Physics 15(5) , 588 (2015); https://doi.org/10.1016/j.cap.2015.01.02210.1016/j.cap.2015.01.022 ↗
28. [28] E. Mellikov, V. Mikli, N. Revathi, O. Volobujeva, (October 2016) (2015).
29. [29] P. Sinsermsuksakul et al., Advanced Energy Materials 4(15) , 1 (2014); https://doi.org/10.1002/aenm.20140049610.1002/aenm.201400496 ↗