journal article·2025-12-15

Investigation of the Influence of Variations in Thickness and Concentration on the Optoelectronic Characteristics of p-CuI/n-InSe Photodetector

Physics Department, College of Education for Pure Science, University of Tikrit, Tikrit, 34001, Iraq, Naeemah A. Aswad, Ayed N. Saleh, Physics Department, College of Education for Pure Science, University of Tikrit, Tikrit, 34001, Iraq

Chalcogenide Letters· Volume 22· Issue 12
Publisher page

Abstract

The SCAPS-1D software was used to simulate a p–CuI/n–InSe photodetector at 300 K with AM1.5G light. The simulation results showed that, with a quantum efficiency of 97.6% at 800 nm and a responsivity of 0.67 A/W, the ideal absorber layer thickness of 0.8 µm produced the highest overall performance. The specific detectivity was enhanced to 2.5 × 1015 cm·Hz1 / 2 ·W−3 and the dark current was decreased by increasing the InSe carrier concentration from 1 × 1015 cm−3 to 3 × 1015 cm−3 . These findings show that the CuI/InSe heterojunction’s broadband response, strong responsivity, and low dark current make it a viable option for near-infrared photodetection applications.
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Research context

OpenAlex topics: Chalcogenide Semiconductor Thin Films · Semiconductor materials and interfaces · Copper-based nanomaterials and applications

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