Conductive‐AFM Patterning of Organic Semiconductors
Source abstract
Abstract
Using a conductive atomic force microscope (c-AFM) redox-writing technique, it is shown that it is possible to locally, and reversibly, pattern conducting, and nonconducting features on the surface of a low molecular weight aniline-based organic (semi)-conductor thin film using a commercial c-AFM. It is shown that application of a voltage between the tip and sample causes localized redox reactions at the surface without damage.
Source: europepmc · Quality: candidate unverified · Source record ↗
Research context
OpenAlex topics: Force Microscopy Techniques and Applications · Nanofabrication and Lithography Techniques · Molecular Junctions and Nanostructures
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
School of Chemistry University of Bristol Bristol BS8 1TS UK
Bristol Centre for Functional Nanomaterials Centre for Nanoscience and Quantum Information University of Bristol Tyndall Avenue Bristol BS8 1FD UK
School of Physics University of Bristol Bristol BS8 1TL UK
Centre for Nanoscience and Quantum Information University of Bristol Bristol BS8 1FD UK
Funding
Bristol Centre for Functional Nanomaterials · Engineering and Physical Sciences Research Council
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