In-Plane Optical Anisotropy of Layered Gallium Telluride
Abstract
Research context
OpenAlex topics: 2D Materials and Applications · Perovskite Materials and Applications · Chalcogenide Semiconductor Thin Films
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Affiliations
Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, United States
Department of Physics, Tohoku University, Sendai 980-8578, Japan
College of Sciences, Liaoning Shihua University, Fushun 113001, China
Department of Nuclear Science and Engineering, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, United States
Department of Physics, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, United States
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, United States
Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences, Shenyang 110016, China
Funding
Ministry of Education, Culture, Sports, Science, and Technology · Division of Emerging Frontiers in Research and Innovation · Army Research Office · National Natural Science Foundation of China