journal article·2016-09-27Open access

In-Plane Optical Anisotropy of Layered Gallium Telluride

Shengxi Huang, Yuki Tatsumi, Xi Ling, Huaihong Guo, Ziqiang Wang, Garrett Watson, Alexander A. Puretzky, David B. Geohegan, Jing Kong, Ju Li, Teng Yang, Riichiro Saito, Mildred S. Dresselhaus

ACS Nano· Volume 10· Issue 9

Abstract

Layered gallium telluride (GaTe) has attracted much attention recently, due to its extremely high photoresponsivity, short response time, and promising thermoelectric performance. Different from most commonly studied two-dimensional (2D) materials, GaTe has in-plane anisotropy and a low symmetry with the C2h(3) space group. Investigating the in-plane optical anisotropy, including the electron-photon and electron-phonon interactions of GaTe is essential in realizing its applications in optoelectronics and thermoelectrics. In this work, the anisotropic light-matter interactions in the low-symmetry material GaTe are studied using anisotropic optical extinction and Raman spectroscopies as probes. Our polarized optical extinction spectroscopy reveals the weak anisotropy in optical extinction spectra for visible light of multilayer GaTe. Polarized Raman spectroscopy proves to be sensitive to the crystalline orientation of GaTe, and shows the intricate dependences of Raman anisotropy on flake thickness, photon and phonon energies. Such intricate dependences can be explained by theoretical analyses employing first-principles calculations and group theory. These studies are a crucial step toward the applications of GaTe especially in optoelectronics and thermoelectrics, and provide a general methodology for the study of the anisotropy of light-matter interactions in 2D layered materials with in-plane anisotropy.
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Research context

OpenAlex topics: 2D Materials and Applications · Perovskite Materials and Applications · Chalcogenide Semiconductor Thin Films

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, United States

Department of Physics, Tohoku University, Sendai 980-8578, Japan

College of Sciences, Liaoning Shihua University, Fushun 113001, China

Department of Nuclear Science and Engineering, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, United States

Department of Physics, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, United States

Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, United States

Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences, Shenyang 110016, China

Funding

Ministry of Education, Culture, Sports, Science, and Technology · Division of Emerging Frontiers in Research and Innovation · Army Research Office · National Natural Science Foundation of China

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