journal article·2017-02-28

Two-Dimensional SnS: A Phosphorene Analogue with Strong In-Plane Electronic Anisotropy

Zhen Tian, Chenglei Guo, Mingxing Zhao, Ranran Li, Jiamin Xue

ACS Nano· Volume 11· Issue 2
Publisher page

Abstract

We study the anisotropic electronic properties of two-dimensional (2D) SnS, an analogue of phosphorene, grown by physical vapor transport. With transmission electron microscopy and polarized Raman spectroscopy, we identify the zigzag and armchair directions of the as-grown 2D crystals. The 2D SnS field-effect transistors with a cross-Hall-bar structure are fabricated. They show heavily hole-doped (∼10 19 cm –3 ) conductivity with strong in-plane anisotropy. At room temperature, the mobility along the zigzag direction exceeds 20 cm 2 V –1 s –1, which can be up to 1.7 times that in the armchair direction. This strong anisotropy is then explained by the effective mass ratio along the two directions and agrees well with previous theoretical predictions. Temperature-dependent carrier density determined the acceptor energy level to be ∼45 meV above the valence band maximum. This value matches a calculated defect level of 42 meV for Sn vacancies, indicating that Sn deficiency is the main cause of the p-type conductivity.
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Research context

OpenAlex topics: 2D Materials and Applications · Perovskite Materials and Applications · MXene and MAX Phase Materials

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China

School of Physical Science and Technology, ShanghaiTech University, Shanghai 201210, China

University of Chinese Academy of Sciences, Beijing 100049, China

Center for Excellence in Superconducting Electronics (CENSE), Chinese Academy of Sciences, Shanghai 200050, China

Funding

Science and Technology Commission of Shanghai Municipality · National Natural Science Foundation of China · Chinese Academy of Sciences

References (50)

Show source-provided references
1. 10.1038/nnano.2014.3510.1038/nnano.2014.35 ↗
2. 10.1126/science.aaa648610.1126/science.aaa6486 ↗
3. 10.1021/nn501226z10.1021/nn501226z ↗
4. 10.1021/nn503893j10.1021/nn503893j ↗
5. 10.1021/acs.nanolett.6b0390710.1021/acs.nanolett.6b03907 ↗
6. 10.1021/acsnano.5b0210410.1021/acsnano.5b02104 ↗
7. 10.1038/ncomms545810.1038/ncomms5458 ↗
8. 10.1038/nature1318410.1038/nature13184 ↗
9. 10.1126/science.aad374910.1126/science.aad3749 ↗
10. 10.1002/adma.20140221910.1002/adma.201402219 ↗
11. 10.1063/1.478985510.1063/1.4789855 ↗
12. 10.1002/aenm.20140049610.1002/aenm.201400496 ↗
13. 10.1103/PhysRevB.93.04543110.1103/PhysRevB.93.045431 ↗
14. 10.1063/1.493475010.1063/1.4934750 ↗
15. 10.1103/PhysRevB.94.03530410.1103/PhysRevB.94.035304 ↗
16. 10.1021/acs.nanolett.6b0072610.1021/acs.nanolett.6b00726 ↗
17. 10.1103/PhysRevLett.117.09760110.1103/PhysRevLett.117.097601 ↗
18. 10.1021/acs.nanolett.5b0461310.1021/acs.nanolett.5b04613 ↗
19. 10.1007/s12274-014-0676-810.1007/s12274-014-0676-8 ↗
20. 10.1039/C5NR07675G10.1039/C5NR07675G ↗
21. 10.1021/ja310801710.1021/ja3108017 ↗
22. 10.1039/C6NR07098A10.1039/C6NR07098A ↗
23. 10.1021/jacs.5b0823610.1021/jacs.5b08236 ↗
24. 10.1039/C5CS00517E10.1039/C5CS00517E ↗
25. 10.1063/1.367588010.1063/1.3675880 ↗
26. 10.1016/0927-0248(94)90158-910.1016/0927-0248(94)90158-9 ↗
27. 10.1088/0268-1242/14/6/30310.1088/0268-1242/14/6/303 ↗
28. 10.1021/jp807380s10.1021/jp807380s ↗
29. 10.1021/nn203377t10.1021/nn203377t ↗
30. 10.1021/nl902623y10.1021/nl902623y ↗
31. 10.1039/C5NR03282B10.1039/C5NR03282B ↗
32. 10.1021/nn501779y10.1021/nn501779y ↗
33. 10.1021/acs.jpclett.5b0168610.1021/acs.jpclett.5b01686 ↗
34. Materials Project.https://www.materialsproject.org/materials/mp-2231/(accessed May 20, 2015).
35. Madelung, O.Semiconductors: Data Handbook,3rd ed.Springer, 2014; pp578–580.
36. 10.1103/PhysRevB.92.11520210.1103/PhysRevB.92.115202 ↗
37. 10.1063/1.481674610.1063/1.4816746 ↗
38. 10.1088/0022-3719/10/11/00310.1088/0022-3719/10/11/003 ↗
39. 10.1103/PhysRevB.15.217710.1103/PhysRevB.15.2177 ↗
40. Schroder, D. K.Semiconductor Material and Device Characterization,3rd ed.Wiley-Interscience, 2006; pp500–502.10.1002/0471749095 ↗
41. 10.1038/ncomms201810.1038/ncomms2018 ↗
42. 10.1063/1.177704710.1063/1.1777047 ↗
43. Markov, I. V.Crystal Growth for Beginners: Fundamentals of Nucleation, Crystal Growth, and Epitaxy,2nd ed.World Scientific Publishing, 2004; pp14–15.10.1142/5172 ↗
44. Garmire, E.; Hammer, J.; Kogelnik, H.; Tamir, T.; Zernike, F.; Cardona, M.Light Scattering in Solids 1;Springer Science & Business Media, 2013; Vol.8, pp22–55.
45. Raman and Hyper-Raman Tensors.http://www.cryst.ehu.es/cryst/transformtensor.html(accessed November 15, 2015).
46. 10.1038/ncomms799110.1038/ncomms7991 ↗
47. 10.1063/1.476821810.1063/1.4768218 ↗
48. 10.1038/nphys78110.1038/nphys781 ↗
49. Shklovskii, B. I.; Efros, A. L.Electronic Properties of Doped Semiconductor;Springer, 1984; pp75–76.10.1007/978-3-662-02403-4 ↗
50. Sze, S. M.; Kwok, K. N.Physics of Semiconductor Devices;Wiley-Interscience, 2007; pp24–25.10.1002/0470068329 ↗