Capacitance Method for Eliminating Gas Ionization Noise in X-ray Detection Performance Testing
Source abstract
Abstract
The exploration of semiconductive materials for direct X-ray detection has aroused intense interest recently, and many perovskites and MOFs claimed to have excellent X-ray detection abilities. However, a recent report indicates that gas ionization introduces significant interference when evaluating the X-ray detection performance under ambient conditions by the widely used two-probe method. This work reveals that the use of a capacitance method may eliminate the gas ionization noise of semiconductor detectors by about 98% (noise signal ratio: CdTe, ∼0; CsPbBr 3, ∼2%; MAPbBr 3, ∼2%). This method does not require high vacuum or encapsulation and is highly suggested for the valuation of X-ray direct detection performance.
Source: openalex_inverted_index · Quality: baseline
Research context
OpenAlex topics: Radiation Detection and Scintillator Technologies · Nuclear Physics and Applications · Atomic and Subatomic Physics Research
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
State Key Laboratory of Structural Chemistry
Fujian Institute of Research on the Structure of Matter, Chinese Academy of Sciences
University of Chinese Academy of Sciences
Funding
National Key Research and Development Program of China · Natural Science Foundation of Fujian Province · National Natural Science Foundation of China · central leading local science and technology development special project of China
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