High-Energy Radiation Stability of Metal Halide Perovskites: Damage Mechanisms, Key Influencing Factors, and Evaluation Standards
Source abstract
Abstract
Metal halide perovskites show great promise as candidates for next-generation high-energy radiation detection, competing with traditional scintillators and semiconductors owing to their high sensitivity and defect tolerance. However, the deployment of robust detectors is currently impeded by inconsistent stability assessments and a lack of rational design principles for radiation hardening. This review addresses these challenges by examining the radiation damage mechanisms specific to various sources, decoupling the complex interplay between ionization-induced self-healing and displacement damage accumulation within the unique soft lattice. We analyze how compositional engineering and dimensionality reduction can effectively suppress defect propagation. Crucially, we identify that long-term reliability is often limited by extrinsic device interfaces rather than the intrinsic perovskite bulk. Furthermore, we highlight the limitations of generic laboratory radiation sources and propose a transition toward application-specific evaluation protocols that distinguish between transient artifacts and intrinsic material degradation. This review aims to provide theoretical guidance and references for designing the next generation of highly radiation-stable perovskite materials and devices.
Source: openalex_inverted_index · Quality: baseline
Research context
OpenAlex topics: Nuclear materials and radiation effects · Perovskite Materials and Applications · Nuclear Materials and Properties
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
State key Laboratory of Advanced Glass Materials
Wuhan University of Technology
School of Materials Science and Engineering
Chaozhou Branch of Chemistry and Chemical Engineering Guangdong Laboratory
Hubei Technology Innovation Center for Advanced Composites
Wuhan National Laboratory for Optoelectronics
Huazhong University of Science and Technology
Funding
National Key Research and Development Program of China · National Natural Science Foundation of China
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