journal article·2025-02-14Open access

The Effect of Charge Carrier Cooling on the Ultrafast Carrier Dynamics in Cs2AgBiBr6 Thin Films

Huygen J. Jöbsis, Lei Gao, Antti-Pekka M. Reponen, Zachary A. VanOrman, Rick P.P.P.M. Rijpers, Hai I. Wang, Sascha Feldmann, Eline M. Hutter

ACS Energy Letters· Volume 10· Issue 2

Abstract

High Resolution Image Download MS PowerPoint Slide Cs 2 AgBiBr 6 shows promise for solution-processable optoelectronics, such as photovoltaics, photocatalysis, and X-ray detection. However, various spectroscopic studies report rapid charge carrier mobility loss in the first picosecond after photoexcitation, limiting carrier collection efficiencies. The origin of this rapid mobility loss is still unclear. Here, we directly compare hot excitation with excitation over the indirect fundamental bandgap, using transient absorption and THz spectroscopy on the same Cs 2 AgBiBr 6 thin film sample. From transient absorption spectroscopy, we find that hot carriers cool toward the band-edges with a cooling rate of 0.58 ps –1, which coincides with the observed mobility loss rate from THz spectroscopy. Hence, our study establishes a direct link between the hot carrier cooling and ultrafast mobility loss on the picosecond time scale.
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Research context

OpenAlex topics: Perovskite Materials and Applications · Electronic and Structural Properties of Oxides · Optical properties and cooling technologies in crystalline materials

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Affiliations

Utrecht University, Princetonlaan 8, 3584 CB Utrecht, The Netherlands

Rowland Institute, Harvard University, 100 Edwin H Land Blvd, Cambridge, Massachusetts 02142, United States

Max Planck Institute for Polymer Research, Ackermannweg 10, 55128 Mainz, Germany

Institute of Chemical Sciences and Engineering, École Polytechnique Fédérale de Lausanne, Rue de l’industrie 17, 1951 Sion, Switzerland

Funding

Exacte en Natuurwetenschappen · Rowland Institute at Harvard · Max-Planck-Gesellschaft · Universiteit Utrecht · China Scholarship Council

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