A resonator microwave sensor for measuring the parameters of Solar-quality silicon
Source abstract
Abstract
Nondestructive microwave and optical methods for contactless local measurements of resistivity, the lifetimes of minority charge carriers in single-crystal and polycrystalline semiconductors, and lifetimes in photoelectric transducers are investigated.
Source: openalex_inverted_index · Quality: baseline
Research context
OpenAlex topics: Semiconductor materials and interfaces · Silicon Nanostructures and Photoluminescence · Thermography and Photoacoustic Techniques
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (14)
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