Benchmarking the Reliability of the Consignments of Semiconductor Articles Using Electrostatic Discharges
Source abstract
Abstract
Five methods that have been developed by the authors since 2006 for benchmarking the reliability of semiconductor articles using electrostatic discharges are described.
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Semiconductor materials and devices · Electrostatic Discharge in Electronics · Sensor Technology and Measurement Systems
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (18)
Show source-provided references
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