journal article·2022-10-14

Solar Cell Efficiency Exceeding 25% through Rb-Based Perovskitoid Scaffold Stabilizing the Buried Perovskite Surface

Jinbo Chen, Hua Dong, Jingrui Li, Xinyi Zhu, Jie Xu, Fang Pan, Ruoyao Xu, Jun Xi, Bo Jiao, Xun Hou, Kar Wei NG, Shuang-Peng Wang, Zhaoxin Wu

ACS Energy Letters· Volume 7· Issue 10
Publisher page

Abstract

The reduction of defect density in perovskite solar cells (PSCs) is the key to suppress the nonradiative recombination, which is critical to achieve high device efficiency. The buried surfaces of perovskite films are more prone to deterioration and defect formation than the bulk and upper surfaces of perovskite films due to continuous solvent and temperature erosion processes. Here, a buried-interface strategy using Rb-based perovskitoids is proposed. The introduction of rubidium halide results in the formation of a deuterogenic Rb-based perovskitoid “scaffold”, which effectively enhances the crystallization of the perovskite film and passivates the defects at the buried surface. With this Rb-based perovskitoid strategy, the power conversion efficiency of device increases from 23.26% to 25.14%, thus providing a simple and effective way to improve the performance of PSCs.
Source: openalex_inverted_index · Quality: baseline

Research context

OpenAlex topics: Perovskite Materials and Applications · Quantum Dots Synthesis And Properties · Chalcogenide Semiconductor Thin Films

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

Key Laboratory for Physical Electronics and Devices of the Ministry of Education & Shaanxi Key Lab of Information Photonic Technique, School of Electronic and Information Engineering, Xi’an Jiaotong University, Xi’an, Shaanxi710049, People’s Republic of China

Collaborative Innovation Center of Extreme Optics, Shanxi University, Taiyuan, Shanxi030006, People’s Republic of China

Electronic Materials Research Laboratory, Key Laboratory of the Ministry of Education and International Center for Dielectric Research, School of Electronic Science and Engineering & International Joint Laboratory for Micro/Nano Manufacturing and Measurement Technology, Xi’an Jiaotong University, Xi’an, Shaanxi710049, People’s Republic of China

College of Science, Xi’an University of Architecture and Technology, Xi’an, Shaanxi710055, People’s Republic of China

Institute of Applied Physics and Materials Engineering, University of Macau, Taipa, Macao SAR999078, People’s Republic of China

Funding

Science and Technology Development Fund · Ministry of Science and Technology of the People's Republic of China · National Natural Science Foundation of China

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