p-Type Al-Doped MoS2 Nanosheet Films: Electronic and Chemical Interface Properties with Gold for Electronic Device Integration
Source abstract
Abstract
High-performance optoelectronic devices based on two-dimensional transition-metal dichalcogenides require precise control of the intrinsic and interfacial properties with metallic contacts. We studied aluminum doping and its effect on the chemical and electronic properties of MoS 2 nanosheet films prepared by plasma-enhanced atomic layer deposition (ALD). We combined photoelectron (XPS/UPS) and UV–vis absorption spectroscopies, revealing that Al introduction decreases the Fermi level-to-valence band energy difference of MoS 2 from 0.61 to 0.04 eV and suppresses Au sputtering damage. Stepwise Au sputtering on MoS 2 films reveals chemical modifications in the undoped nanosheets, whereas Al doping stabilizes the material, preventing such an alteration. These findings highlight the potential of Al doping not only for precise control of electronic properties but also for improving the chemical stability of MoS 2 nanosheets, making them more suitable for advanced optoelectronic applications.
Source: openalex_inverted_index · Quality: baseline
Research context
OpenAlex topics: 2D Materials and Applications · MXene and MAX Phase Materials · Electrocatalysts for Energy Conversion
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
Surface Science Laboratory, Department of Materials- and Geosciences, Technical University of Darmstadt, Peter-Grünberg-Straße 4, 64287 Darmstadt, Germany
Nantes Université, CNRS, Institut des Matériaux de Nantes Jean Rouxel, IMN
Department of Applied Physics and Science Education
Eindhoven University of Technology
Department of Chemistry, University of Michigan, 930 N University Avenue, Ann Arbor, Michigan 48109, United States
Funding
Deutsche Forschungsgemeinschaft
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