Characterization of inorganic materials with photoacoustic spectrophotometry
Source abstract
Abstract
Abstract A photoacoustic spectrometer is described which has been constructed to measure the spectra of photovoltaic or other solid materials in the ultraviolet (UV), visible and near infrared regions. The range of this photoacoustic spectrometer is from 0.3 to 1.8 μm. The spectrometer was used to characterize the optical properties of polycrystalline and single phase p-CuInSe2 thin films which were grown by selenization of sputtered Cu/In multilayer at a temperature of 500°C. The films showed a three-fold optical structure with three high energy transitions, which is the characteristic behavior of the material. The photoacoustic spectrum is reported and discussed.
Source: openaire · Quality: candidate unverified · Source record ↗
Research context
OpenAlex topics: Thermography and Photoacoustic Techniques · Chalcogenide Semiconductor Thin Films · Advanced Semiconductor Detectors and Materials
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (15)
Show source-provided references
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