Optical properties of porous silicon.
Source abstract
Abstract
The wavelength dependent optical parameters such as refractive index n and absorption coefficient α of porous silicon (PS) have been calculated from optical transmission spectra of plan-parallel films having different porosities. Since the effects of manufacturing conditions on film porosity and thickness have been investigated as well, a complete set of data is obtained enabling the design and easy realization of PS layers with certain structural and optical properties in advanced applications for optoelectronics and sensors.
Source: expertdata · Quality: candidate unverified · Source record ↗
Research context
OpenAlex topics: Silicon Nanostructures and Photoluminescence · Nanowire Synthesis and Applications · Semiconductor materials and devices
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (18)
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