journal article·2026-06-26Open access

Onset of in-plane ferroelectricity in the vanadium dioxide (VO 2 ) mott insulator for in-memory computing applications

M Dragoman, F Nastase, M Modreanu, S Vulpe, B Sheehan, C Romanitan, D Dragoman, A E Bocirnea, M Drob, P Dubreuil, S Calvez

Nanotechnology· Volume 37· Issue 25

Abstract

Abstract We present experimental results on VO 2 , which is the most utilized Mott material, grown by atomic layer deposition on single-crystalline Si (100) (VO 2 /Si) wafers and followed by thermal treatment at 500 °C for different times: 30, 60 and 90 min. All these structures have shown in-plane ferroelectricity, the best results being obtained for VO 2 treated thermically at 500 °C during 60 min. The remanent polarization in this case is 100 μ C cm −2 at room temperature at coercive voltages ±10 V. Current-voltage and polarization-voltage dependences at various temperatures have shown that VO 2 has a reversible insulator-metal transition at 66 °C.
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Research context

OpenAlex topics: Transition Metal Oxide Nanomaterials · Chemical and Physical Properties of Materials · Advanced Materials and Semiconductor Technologies

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

National Institute for Research and Development in Microtechnologies, IMT-Bucharest

Tyndall National Institute-University College Cork, Lee Maltings, Dyke Parade

University of Bucharest, Physics Faculty, PO Box MG-11

Academy of Romanian Scientists, Str. Ilfov, Nr. 3

National Institute of Materials Physics, Atomistilor 405A

Université de Toulouse, CNRS

Funding

CFA Midisup and Erasmus+ · Renatech French national network · Ministry of Education and Research · LAAS-CNRS micro

References (37)

Show source-provided references
1. Vanadium dioxide (VO2) is also a ferroelectric: properties from memory structures
2. Mott memory and neuromorphic devices10.1109/JPROC.2015.2431914 ↗
3. Recent progress in vanadium dioxide: the multi-stimuli responsive material and its applications10.1016/j.mser.2023.100747 ↗
4. Vanadium oxide: phase diagrams, structures, synthesis, and applications10.1021/acs.chemrev.2c00546 ↗
5. Recent advancements in reconfigurable mmwave devices based on phase-change and metal insulator transition materials10.1109/JMW.2023.3247360 ↗
6. Terahertz metasurfaces exploiting the phase transition of vanadium dioxide10.3390/ma16227106 ↗
7. VO2 thin film enabled free space modulation of infrared light using pulsed electric field10.1021/acsphotonics.4c00489 ↗
8. A review of Mott insulators in memristors: the materials, characteristics, applications for future computing systems and neuromorphic computing10.1007/s12274-022-4773-9 ↗
9. Review of memristor devices in neuromorphic computing: materials sciences and device challenges10.1088/1361-6463/aade3f ↗
10. Electric-field-induced metal-insulator transition for low-power and ultrafast nanoelectronics10.3390/nano15080589 ↗
11. Field-induced reversible insulator-to-metal transition and the onset of ferroelectricity in molybdenum trioxide films10.1063/5.0151117 ↗
12. Oxygen-vacancy induced ferroelectricity in nitrogen-doped nickel oxide10.1063/5.0075568 ↗
13. The first molecular ferroelectric Mott insulator10.1002/adma.202414560 ↗
14. Record high room temperature resistance switching in ferroelectric-gated Mott transistors unlocked by interfacial charge engineering10.1038/s41467-023-44036-x ↗
15. Modulation of VO2 metal-insulator- transition by ferroelectric HfO2 gate insulator10.1002/aelm.201901356 ↗
16. Ferroelectric control of a Mott insulator10.1038/srep02834 ↗
17. Electric fields in correlated oxide systems10.1038/nature01878 ↗
18. Subthreshold firing in Mott nanodevices10.1038/s41586-019-1159-6 ↗
19. Electric field-Induced Tunable Insulator-to-Metal Transition at Room-Temperature in NiO/ferroelectric heterostructures10.1088/1361-6528/ae1e83 ↗
20. Memory devices and applications for in-memory computing10.1038/s41565-020-0655-z ↗
21. Fast Fourier transform and multi-Gaussian fitting of XRR data to determine the thickness of ALD grown thin films within the initial growth regime10.1063/5.0024991 ↗
22. A profile refinement method for nuclear and magnetic structures10.1107/S0021889869006558 ↗
23. Increment in evolution of cellulose crystallinity analysis10.1007/s10570-020-03172-z ↗
24. The effect of oxygen flow rate on metal–insulator transition (MIT) characteristics of vanadium dioxide (VO2) thin films by pulsed laser deposition (PLD)10.1016/j.apsusc.2020.146995 ↗
25. Microstructure of VO2 thin films synthesized by pulsed laser deposition10.59277/romjist.2024.2.09 ↗
26. XPS studies of vanadium and vanadium oxides10.1016/0368-2048(83)85090-7 ↗
27. Theory of Raman scattering in Mott-Hubbard systems10.1103/PhysRevLett.65.1068 ↗
28. Strain and temperature dependence of the insulating phases of VO2 near the metal-insulator transition10.1103/PhysRevB.85.020101 ↗
29. Novel study of strain-induced piezoelectricity in VO210.1021/acsomega.2c00645 ↗
30. Assignment of the Raman modes of VO2 in the monoclinic insulating phase10.3938/jkps.58.100 ↗
31. Raman Spectrum of Semiconducting and Metallic VO210.1103/PhysRevLett.27.727 ↗
32. Role of V–V dimers on structural, electronic, magnetic, and vibrational properties of VO2 by first-principles simulations and Raman spectroscopic analysis10.1103/PhysRevB.103.214107 ↗
33. A review of Raman spectroscopy of vanadium oxides10.1002/jrs.5616 ↗
34. Symmetry relationship and strain-induced transitions between insulating M1 and M2 and metallic R phases of vanadium dioxide10.1021/nl1020443 ↗
35. Local coexistence of VO2 phases revealed by deep data analysis10.1038/srep29216 ↗
36. Polarization degradation and recovery strategies of hafnia-based ferroelectric capacitors after thermal budget in back-end of line process10.1109/IEDM50854.2024.10873476 ↗
37. In‐plane ferroelectrics enabling reduced hysteresis in monolayer MoS2 transistors10.1002/cnl2.148 ↗