Pseudo-refractive index and excitonic features of single layer CdSe/CdS core–shell nanoplatelet films

Abstract Semiconductor CdSe/CdS core–shell nanoplatelets exhibit narrow and intense absorption and photoluminescence spectra in the visible range, which makes them suitable for numerous applications in optoelectronics. Of particular interest is the preparation and optical characterization of thin films with an accurately controlled amount of nanoplatelets. Here we report on the use of spectroscopic ellipsometry for investigating the optical properties of ultrathin films composed of a single layer of negatively charged CdSe/CdS core–shell nanoplatelets prepared by the electrostatic layer-by-layer deposition on SiO ₂ /Si substrates. Combining the ellipsometric spectra with atomic force microscopy measurements, we were able to infer the nanoplatelet film extinction spectra which was found to exhibit the two characteristic exciton peaks albeit blueshifted relative to the colloidal nanoplatelets.