journal article·2020

Insight into the Ga/In flux ratio and crystallographic plane dependence of MBE self-assembled growth of InGaN nanorods on patterned sapphire substrates

Jian Shen, Yuefeng Yu, Jia Wang, Yulin Zheng, Yang Gan, Guoqiang Li

Nanoscale· Volume 12· Issue 6
Publisher page

Abstract

-plane-(4 5[combining macron] 1 38) plane-on a hexagonal pyramid favors the highest density, largest aspect ratio, and best uniformity of semipolar InGaN NRs, thus contributing to optimal photoluminescence performance. A thorough understanding of the mechanism of the effect of the Ga/In flux ratio and crystallographic plane on the MBE self-assembled growth behaviour of InGaN NRs was gained through experimental and theoretical exploration. This work contributes towards a deep understanding of the MBE self-assembled growth mechanism and controllable fabrication of dense, well-separated, and uniform InGaN NRs, thus contributing to the enhanced performance of NR-based optoelectronic devices.
Source: openalex_inverted_index · Quality: candidate unverified · Source record ↗

Research context

OpenAlex topics: GaN-based semiconductor devices and materials · Ga2O3 and related materials · ZnO doping and properties

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

State Key Laboratory of Luminescent Materials and Devices

South China University of Technology

Guangzhou 510640

China

School of Chemistry and Chemical Engineering

Engineering Research Center on Solid-State Lighting and its Informationisation of Guangdong Province

Center for Integrated Research of Future Electronics

and Institute of Materials and Systems for Sustainability

Nagoya University

Nagoya 464-8601

Japan

Harbin Institute of Technology

Harbin 150001

Funding

National Basic Research Program of China · National Outstanding Youth Science Fund Project of National Natural Science Foundation of China · National Natural Science Foundation of China · China Postdoctoral Science Foundation

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