journal article·2025Open access

Epitaxial growth of antiferromagnetic MnBi 2 Te 4 /CdTe heterostructures on GaAs(001) using molecular beam epitaxy: structure and electronic properties

Wesley F. Inoch, Gilberto Rodrigues-Junior, S. L. A. Mello, S. de Castro, M. L. Peres, Sukarno O. Ferreira, Ângelo Malachias, Maybi F. Sampaio, Olavo Teixeira Neto, Bráulio S. Archanjo, Leonarde N. Rodrigues

Nanoscale· Volume 17· Issue 16

Abstract

MnBi2Te4 is one of the most recent materials that integrates the class of topological quantum materials exhibiting topological insulating properties and magnetic ordering, thus providing the opportunity to investigate particular topological quantum states and design novel spintronic devices. The samples were grown on GaAs(100) substrates using molecular beam epitaxy with Bi2Te3, Te and Mn as sources. The growth was characterized through X-ray diffraction, atomic force microscopy and transmission electron microscopy. Topological insulator properties were probed through scanning tunneling microscopy and scanning tunneling spectroscopy, while antiferromagnetic order was investigated via magnetotransport measurements. Furthermore, we propose a high-quality CdTe thin film as a cap layer to protect topological surface states, thus opening the possibility of integrating topological quantum materials with group II-VI semiconductors via van der Waals epitaxy.
Source: europepmc · Quality: candidate unverified · Source record ↗

Research context

OpenAlex topics: Chalcogenide Semiconductor Thin Films · Heusler alloys: electronic and magnetic properties · Advanced Semiconductor Detectors and Materials

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

Departamento de Física, Instituto de Ciências Exatas (ICE), Universidade Federal de Viçosa, Viçosa, Minas Gerais 36570-900, Brasil

Instituto de Física e Química, Universidade Federal de Itajubá, Itajubá, Minas Gerais 37500-903, Brasil

Departmento de Física, Instituto de Ciências Exatas (ICEx), Universidade Federal de Minas Gerais (UFMG), Av. Antônio Carlos, 6627, Belo Horizonte, Minas Gerais 30123-970, Brasil

Instituto Nacional de Metrologia, Qualidade e Tecnologia (Inmetro), Divisão de Materiais (DIMAT), Xerém, 25250-020, Rio de Janeiro, Brasil

Funding

Coordenação de Aperfeiçoamento de Pessoal de Nível Superior · Fundação de Amparo à Pesquisa do Estado de Minas Gerais · Conselho Nacional de Desenvolvimento Científico e Tecnológico

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