Interface States in Bilayer Graphene Encapsulated by Hexagonal Boron Nitride
Source abstract
Abstract
The threshold voltages at the onset of conduction for electron and hole branches can provide information on band gap values or interface states in a gap. We measured conductivity of bilayer graphene encapsulated by hexagonal boron nitride as a function of back and top gates, where another bilayer graphene is used as a top gate. From the measured conductivity the transport gap values were extracted assuming zero interface trap states, and they are close to the theoretically expected gap values. From a little discrepancy an average density of interface states per energy within a band gap (Dit) is also estimated. The data clearly show that Dit decreases as a bilayer graphene band gap increases rather than being constant. Despite the decreasing trend of Dit, interestingly the total interface states within a gap increases linearly as a band gap increases. This is because of ∼2 × 1010 cm–2 interface states localized at band edges even without a band gap, and other gap states are equally spread over the gap.
Source: openalex_inverted_index · Quality: baseline
Research context
OpenAlex topics: Graphene research and applications · Graphene and Nanomaterials Applications · 2D Materials and Applications
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
Microelectronics Research Center, The University of Texas at Austin, Austin, Texas 78758, United States
School of Materials Science and Engineering, Gwangju Institute of Science and Technology, Gwangju 61005, South Korea
National Institute for Materials Science, 1-1 Namiki Tsukuba, Ibaraki 305-0044, Japan
Department of Electrical Engineering, Chungnam National University, Daejeon 34134, South Korea
Funding
National Research Foundation of Korea · Semiconductor Research Corporation
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