Probing Electrified Liquid–Solid Interfaces with Scanning Electron Microscopy
Source abstract
Abstract
Electrical double layers play a key role in a variety of electrochemical systems. The mean free path of secondary electrons in aqueous solutions is on the order of a nanometer, making them suitable for probing ultrathin electrical double layers at solid-liquid electrolyte interfaces. Employing graphene as an electron-transparent electrode in a two-electrode electrochemical system, we show that the secondary electron yield of the graphene-liquid interface depends on the ionic strength and concentration of the electrolyte and the applied bias at the remote counter electrode. These observations have been related to polarization-induced changes in the potential distribution within the electrical double layer and demonstrate the feasibility of using scanning electron microscopy to examine and map electrified liquid-solid interfaces.
Source: openalex_inverted_index · Quality: baseline
Research context
OpenAlex topics: Electrochemical Analysis and Applications · Analytical Chemistry and Sensors · Iron oxide chemistry and applications
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
SEU-FEI Nano-Pico Center, Key Laboratory of MEMS of Ministry of Education, Southeast University, Nanjing 210096, P. R. China
Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States
Maryland Nanocenter, University of Maryland, College Park, Maryland 20742, United States
Department of Physics and CICECO—Aveiro Institute of Materials, University of Aveiro, Aveiro 3810-193, Portugal
Funding
National Institute of Standards and Technology · University of Maryland · Funda??o para a Ci?ncia e a Tecnologia
References (39)
Show source-provided references
1. Simon P. · 2010 · 320
2. Bach K. · 2012
3. 10.1021/cr100232610.1021/cr1002326 ↗
4. 10.1088/0022-3727/31/18/02110.1088/0022-3727/31/18/021 ↗
5. 10.1103/revmodphys.80.83910.1103/revmodphys.80.839 ↗
6. 10.1021/cr200206810.1021/cr2002068 ↗
7. 10.1021/jp200544b10.1021/jp200544b ↗
8. 10.1021/nl403108310.1021/nl4031083 ↗
9. 10.1063/1.487007410.1063/1.4870074 ↗
10. 10.1021/acs.chemrev.6b0044810.1021/acs.chemrev.6b00448 ↗
11. 10.1021/acs.nanolett.9b0189710.1021/acs.nanolett.9b01897 ↗
12. 10.1016/s0009-2614(99)01451-710.1016/s0009-2614(99)01451-7 ↗
13. 10.1039/c7nr08257f10.1039/c7nr08257f ↗
14. 10.1021/j100252a00510.1021/j100252a005 ↗
15. 10.1016/j.surfrep.2008.01.00110.1016/j.surfrep.2008.01.001 ↗
16. 10.1016/j.nima.2008.12.15510.1016/j.nima.2008.12.155 ↗
17. 10.1021/cr040381p10.1021/cr040381p ↗
18. 10.1039/b800717a10.1039/b800717a ↗
19. 10.1016/j.elspec.2015.06.00810.1016/j.elspec.2015.06.008 ↗
20. 10.1103/physrevlett.111.17300510.1103/physrevlett.111.173005 ↗
21. 10.1103/physrevx.6.01100710.1103/physrevx.6.011007 ↗
22. 10.1021/acsanm.9b0193910.1021/acsanm.9b01939 ↗
23. 10.1038/ncomms1269510.1038/ncomms12695 ↗
24. 10.1038/nnano.2011.13010.1038/nnano.2011.130 ↗
25. 10.1088/0957-4484/23/50/50570410.1088/0957-4484/23/50/505704 ↗
26. 10.1021/acsami.7b0282410.1021/acsami.7b02824 ↗
27. 10.1039/c5cp04058b10.1039/c5cp04058b ↗
28. 10.1002/anie.20150604410.1002/anie.201506044 ↗
29. 10.1021/jacs.7b0736510.1021/jacs.7b07365 ↗
30. 10.1007/s11244-018-1065-410.1007/s11244-018-1065-4 ↗
31. 10.1021/jacs.8b1228410.1021/jacs.8b12284 ↗
32. 10.1021/acsami.0c0837910.1021/acsami.0c08379 ↗
33. 10.1002/eom2.1202310.1002/eom2.12023 ↗
34. 10.1016/j.susc.2020.12160810.1016/j.susc.2020.121608 ↗
35. 10.1103/physrevlett.106.11680410.1103/physrevlett.106.116804 ↗
36. 10.1021/nl303611v10.1021/nl303611v ↗
37. 10.1016/j.ultramic.2015.01.00410.1016/j.ultramic.2015.01.004 ↗
38. 10.1021/acs.nanolett.9b0482310.1021/acs.nanolett.9b04823 ↗
39. Jablonski, A.; Salvat, F.; Powell, C. J.; Lee, A. Y. NIST Electron Elastic-Scattering Cross-Section Database Version 4.0; National Institute of Standards and Technology: Gaithersburg MD, 20899, 2016.