journal article·2009-04-29

Energy Level Alignment at the Anode of Poly(3-hexylthiophene)/Fullerene-Based Solar Cells

Chih-Ping Chen, Ta-Chang Tien, Bao-Tsan Ko, Yeu-Ding Chen, Ching Ting

Publisher page

Abstract

We have used ultraviolet photoelectron spectroscopy to investigate the energy-level and band alignment near the anode for poly(3-hexylthiophene)/[6,6]-phenyl-C(61)-butyric acid methyl ester (P3HT/PCBM)-based organic solar cells. Analysis of various batches of indium-tin oxide (ITO) revealed that the photoresist residues had a strong effect, reducing the work functions of ITO (Phi(ITO)) by as much as 0.61 eV. The energy-level alignment of poly(3,4-ethylenedioxythiophene)/ITO (Phi(PEDOT/ITO)) interfaces obey the Mott-Schottky rule at values of Phi(ITO) of less than 3.92 eV. In contrast, we observed Fermi-level pinning for the blend/PEDOT interfaces at values of Phi(PEDOT/ITO) greater than 4.26 eV; this finding is consistent with a previous report that the positive polaronic energy of P3HT is equal to 4.0 eV. Consequently, we suspect that the similar efficiency levels and open-circuit voltages of devices prepared from various ITO samples were due mainly to the constant interfacial energy barrier at the blend/PEDOT interface with Fermi-level pinning.
Source: openalex_inverted_index · Quality: baseline

Research context

OpenAlex topics: Organic Electronics and Photovoltaics · Conducting polymers and applications · Semiconductor materials and interfaces

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

Material and Chemical Research Laboratories and Nanotechnology Research Center, Industrial Technology Research Institute, Hsinchu, Taiwan 310, Republic of China, and Department of Chemistry, Center for Nanotechnology, Chung-Yuan Christian University, Chung-Li, Taiwan 320, Republic of China

References (23)

Show source-provided references
1. Gunes S. · Chem. Rev. · 2007 · 107 · 132410.1021/cr050149z ↗
2. Kim J. Y. · Science · 2007 · 317 · 22210.1126/science.1141711 ↗
3. Gur I. · Nano Lett. · 2007 · 7 · 40910.1021/nl062660t ↗
4. Kim J. Y. · Adv. Mater. · 2006 · 18 · 57210.1002/adma.200501825 ↗
5. Li G. · Nat. Mater. · 2005 · 4 · 86410.1038/nmat1500 ↗
6. Scharber M. C. · Adv. Mater. · 2006 · 18 · 78910.1002/adma.200501717 ↗
7. Koster L. J. · Appl. Phys. Lett. · 2006 · 88 · 09351110.1063/1.2181635 ↗
8. Murdey R. J. · Jpn. J. Appl. Phys. · 2005 · 44 · 375110.1143/JJAP.44.3751 ↗
9. Ishii H. · Adv. Mater. · 1999 · 8 · 60510.1002/(SICI)1521-4095(199906)11:8<605::AID-ADMA605>3.0.CO;2-Q ↗
10. Sugiyama K. · J. Appl. Phys. · 2000 · 87 · 29510.1063/1.371859 ↗
11. Fukagawa H. · Adv. Mater. · 2007 · 19 · 66510.1002/adma.200601678 ↗
12. Schlaf R. · J. Electron Spectrosc. Relat. Phenom. · 2001 · 120 · 14910.1016/S0368-2048(01)00310-3 ↗
13. Ishii M. · J. Lumin. · 2000 · 87 · 116510.1016/S0022-2313(99)00581-5 ↗
14. Briggs, D. and Seah, M. P.Practical Surface Analysis: By Auger and X-Ray Photoelectron Spectroscopy;John Wiley & Sons:New York, 1983; p33.
15. Jong M. P. · Appl. Phys. Lett. · 2000 · 77 · 225510.1063/1.1315344 ↗
16. Davids P. S. · J. Appl. Phys. · 1995 · 78 · 424410.1063/1.359886 ↗
17. Davids P. S. · Phys. Rev. B · 1996 · 53 · 482310.1103/PhysRevB.53.4823 ↗
18. Tengstedt C. · Appl. Phys. Lett. · 2006 · 88 · 035350210.1063/1.2168515 ↗
19. Greczynski G. · J. Electron Spectrosc. Relat. Phenom. · 2001 · 120 · 14910.1016/S0368-2048(01)00310-3 ↗
20. Ito E. · Chem. Phys. Lett. · 1999 · 287 · 13710.1016/S0009-2614(98)00153-5 ↗
21. Peisert H. · Appl. Phys. Lett. · 2003 · 83 · 393010.1063/1.1622783 ↗
22. Peisert H. · ChemPhysChem · 2007 · 8 · 38610.1002/cphc.200600542 ↗
23. Frohne H. · ChemPhysChem · 2002 · 3 · 79510.1002/1439-7641(20020916)3:9<795::AID-CPHC795>3.0.CO;2-A ↗