journal article·2016-02-24Open access

Probing Ternary Solvent Effect in High Voc Polymer Solar Cells Using Advanced AFM Techniques

Chao Li, Yi Ding, Mikhael Soliman, Josie Lorenzo, Nitesh Dhasmana, Panit Chantharasupawong, Anton V. Ievlev, Andre J. Gesquiere, Laurene Tetard, Jayan Thomas

Abstract

This work describes a simple method to develop a high V(oc) low band gap PSCs. In addition, two new atomic force microscopy (AFM)-based nanoscale characterization techniques to study the surface morphology and physical properties of the structured active layer are introduced. With the help of ternary solvent processing of the active layer and C60 buffer layer, a bulk heterojunction PSC with V(oc) more than 0.9 V and conversion efficiency 7.5% is developed. In order to understand the fundamental properties of the materials ruling the performance of the PSCs tested, AFM-based nanoscale characterization techniques including Pulsed-Force-Mode AFM (PFM-AFM) and Mode-Synthesizing AFM (MSAFM) are introduced. Interestingly, MSAFM exhibits high sensitivity for direct visualization of the donor-acceptor phases in the active layer of the PSCs. Finally, conductive-AFM (cAFM) studies reveal local variations in conductivity in the donor and acceptor phases as well as a significant increase in photocurrent in the PTB7:ICBA sample obtained with the ternary solvent processing.
Source: openalex_inverted_index · Quality: baseline

Research context

OpenAlex topics: Organic Electronics and Photovoltaics · Thin-Film Transistor Technologies · Conducting polymers and applications

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

NanoScience Technology Center, University of Central Florida, Orlando, Florida 32826, United States,

Department of Material Science and Engineering, University of Central Florida, Orlando, Florida 32816, United States

CREOL, College of Optics and Photonics, University of Central Florida, Orlando, Florida 32816, United States

The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, 1 Bethel Valley Road, Oak Ridge, Tennessee 37831, United States

Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, 1 Bethel Valley Rd., Oak Ridge, Tennessee 37831, United States

Department of Chemistry, University of Central Florida, Orlando, Florida 32816, United States

Funding

Division of Electrical, Communications and Cyber Systems · Division of Civil, Mechanical and Manufacturing Innovation

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