journal article·2019-11-27

Breaking Lattice Symmetry in Highly Strained Epitaxial VO2 Films on Faceted Nanosurface

Yanda Ji, Zhimin Qi, Shikhar Misra, Rongqiang Jin, Xin Ou, Yuan Lin, Hao Yang, Haiyan Wang

ACS Applied Materials & Interfaces· Volume 11· Issue 47
Publisher page

Abstract

The lattice symmetry of strongly correlated oxide heterostructures determines their exotic physical properties by coupling the degrees of freedom between lattices and electrons, orbitals, and spin states. Systematic studies on VO2, a Mott insulator, have previously revealed that lattice distortion can be manipulated by the interfacial strain and electronic phase separation can emerge. However, typical epitaxial film-substrate interface strain provides a very limited range for exploring such interface-engineered phenomena. Herein, epitaxially grown VO2 thin films on asymmetrically faceted m-plane sapphire substrates with the hill-and-valley type surfaces have been demonstrated. Interestingly, lattice symmetry breaking has been proven based on the large residual strain from the different faceted planes. By this lattice symmetry breaking, electronic phase separation and metal–insulator transition in the VO2 films are modulated, and anisotropy in optical responses is exhibited. These results on asymmetrical interfacial engineering in oxide heterostructures open up new routes for novel functional materials design and functional electro/optic device nanofabrication.
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Research context

OpenAlex topics: Transition Metal Oxide Nanomaterials · ZnO doping and properties · Gas Sensing Nanomaterials and Sensors

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

Department of Applied Physics, College of Science, Nanjing University of Aeronautics and Astronautics, 211106 Nanjing, P. R. China

School of Materials Engineering, Purdue University, West Lafayette, Indiana 47907, United States

State Key Laboratory of Functional Material for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, 200250 Shanghai, P. R. China

State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, 610054 Chengdu, P. R. China

Funding

National Natural Science Foundation of China · Division of Materials Research

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