Corrosion Resistance of Nanosized Silicon Carbide-Rich Composite Coatings Produced by Noble Gas Ion Mixing
Source abstract
Abstract
Ion beam mixing has been used to produce a silicon carbide (SiC)-rich nanolayer for protective coating. Different C/Si/C/Si/C/Si(substrate) multilayer structures (with individual layer thicknesses falling in the range of 10–20 nm) have been irradiated by Ar + and Xe + ions at room temperature in the energy and fluence ranges of 40–120 keV and 1–6 × 10 16 ion/cm 2, respectively. The effects of ion irradiation, including the in-depth distribution of the SiC produced, was determined by Auger electron spectroscopy depth profiling. The thickness of the SiC-rich region was only some nanometers, and it could be tailored by changing the layer structure and the ion irradiation conditions. The corrosion resistance of the layers was investigated by potentiodynamic electrochemical test in 4 M KOH solution. The measured corrosion resistance of the SiC-rich layers was orders of magnitude better than that of pure silicon, and a correlation was found between the corrosion current density and the effective areal density of the SiC.
Source: openalex_inverted_index · Quality: baseline
Research context
OpenAlex topics: Metal and Thin Film Mechanics · Diamond and Carbon-based Materials Research · Advanced ceramic materials synthesis
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
Institute for Technical Physics and Materials Science, Centre for Energy Research, Hungarian Academy of Sciences, Konkoly Thege M. út 29-33, H-1121 Budapest, Hungary
Wigner Research Centre for Physics, Hungarian Academy of Sciences, Konkoly-Thege M. út 29-33, H-1121 Budapest, Hungary
Jožef Stefan Institute, Jamova 39, 1000 Ljubljana, Slovenia
Funding
Horizon 2020 Framework Programme · Nemzeti Kutat?si, Fejleszt?si ?s Innov?ci?s Hivatal
References (29)
Show source-provided references
1. 10.1021/acsami.7b0666110.1021/acsami.7b06661 ↗
2. Cheung R. · 200610.1142/p426 ↗
3. 10.1016/S0924-4247(99)00335-010.1016/S0924-4247(99)00335-0 ↗
4. 10.1116/1.480790210.1116/1.4807902 ↗
5. 10.1002/pssb.20084413510.1002/pssb.200844135 ↗
6. 10.1109/TPS.2005.84533910.1109/TPS.2005.845339 ↗
7. 10.1088/0957-4484/17/13/00810.1088/0957-4484/17/13/008 ↗
8. 10.1016/j.tsf.2011.02.08910.1016/j.tsf.2011.02.089 ↗
9. 10.1016/j.apsusc.2014.11.08610.1016/j.apsusc.2014.11.086 ↗
10. 10.1016/S0168-583X(01)01068-010.1016/S0168-583X(01)01068-0 ↗
11. 10.1088/0953-8984/19/2/02621910.1088/0953-8984/19/2/026219 ↗
12. 10.1103/PhysRevB.69.16541110.1103/PhysRevB.69.165411 ↗
13. 10.1103/PhysRevB.59.2010.1103/PhysRevB.59.20 ↗
14. 10.1016/j.apsusc.2012.09.06310.1016/j.apsusc.2012.09.063 ↗
15. 10.1016/j.surfcoat.2014.11.03210.1016/j.surfcoat.2014.11.032 ↗
16. 10.1016/S0168-583X(00)00461-410.1016/S0168-583X(00)00461-4 ↗
17. 10.1016/j.nimb.2005.11.04410.1016/j.nimb.2005.11.044 ↗
18. 10.1016/j.apsusc.2009.02.07510.1016/j.apsusc.2009.02.075 ↗
19. 10.1016/j.surfcoat.2016.06.03910.1016/j.surfcoat.2016.06.039 ↗
20. Möller W. · 2001
21. 10.1088/0022-3727/49/18/18530310.1088/0022-3727/49/18/185303 ↗
22. Childs K. D. · 1995
23. 10.1002/sia.310110.1002/sia.3101 ↗
24. Ziegler, J. F.SRIM Stopping and Range of Ions in Matter, ver. SRIM, 2013.www.srim.org.
25. 10.1149/1.242849610.1149/1.2428496 ↗
26. 10.1111/j.1151-2916.1989.tb06217.x10.1111/j.1151-2916.1989.tb06217.x ↗
27. 10.1016/j.jallcom.2017.05.16910.1016/j.jallcom.2017.05.169 ↗
28. Revie R. · 2000
29. 10.1016/0378-5963(79)90073-410.1016/0378-5963(79)90073-4 ↗